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Description
Product Details Designed for Measurement Calibration; Ideal for Microscopes and Machine Vision Systems Includes Ronchi Rulings, Concentric Circles, Square Grids, and a Linear Microscale Two Targets Available for Different Magnifications NIST Certificate of Accuracy Included Use these “all-in-one” targets to measure microscope and vision system parameters, without separate calibration targets. Targets will test and calibrate our Mitutoyo objectives, Zeiss microscopes, and high magnification video lenses for resolution, distortion, and depth of field (DOF). Targets include variable frequency Ronchi rulings, sets of grids and concentric circles with varying line spacings and widths, a microscale, and edge blocks to prop up target for DOF measurements. Use Low Frequency Target for optical systems with 4X to 20X objectives. Target is useful for machine vision systems with low magnifications and long focal distances. Use High Frequency Target for optical systems with 20X to 100X objectives. Target is useful for microscopes and other systems with high magnifications and short focal distances. Specifications Physical & Mechanical Properties Dimensions (inches): 1 x 3 Thickness (mm): 6.35 Overall Accuracy (μm): ±1.0 Parallelism (arcmin): 1.00 Optical Properties Coating: Evaporated Chrome Pattern Substrate: Many glass manufacturers offer the same material characteristics under different trade names. Learn More Fused Silica (Corning 7980) Surface Quality: 20-10 Surface Flatness (P-V): 3 – 4λ Regulatory Compliance RoHS 2015: Compliant × Certificate of Conformance: View × Reach 240: Compliant ×
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1300nm CWL, 12nm FWHM, 12.5mm Mounted Diameter
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700nm CWL, 80nm FWHM, 12.5mm Mounted Diameter
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766nm CWL, 10nm FWHM, 25mm Mounted Diameter
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