BeamR2-Si Scanning Slit Beam Profiler

Product Details Designed For Use From 190 to 1150nm Measure Beam Diameters of 2µm to 4mm Robust Easy to Use Software Provided DataRay Scanning Slit Beam Profilers feature a silicon detector making it perfect for a 190 to 1150nm spectral range. Equipped with 2.5µm slits and larger knife-edge slits, the Beam’R2 is capable of measuring beams with diameters down to 2µm. Scanning slit instruments offer much higher resolution than camera-based systems, and are compatible with both continuous wave and pulsed laser sources. DataRay Scanning Slit Beam Profilers are ideal for optical assembly and instrument alignment, real-time diagnosis of focusing and alignment errors, real-time setting of multiple assemblies to the same focus. These profilers are USB 2.0 powered and include a 3m USB 2.0 cable. Specifications Physical & Mechanical Properties Dimensions (mm): 60.96 x 67.31 x 66.17 Dimensional Accuracy: ±1µm Optical Properties Spectral Range: 190 – 1150 Beam Diameter (μm): 2µm to 4mm Sensor Frame Rate: 5Hz Electrical Signal to Noise S/N Ratio (dB): 1‚000:1 Maximum Power (W): 1 W Total & 0.5 mW/µm² Threading & Mounting Mount: 1/4-20 thread Regulatory Compliance RoHS 2015: Exempt × Certificate of Conformance: View × REACH 241: Contains SVHC(s) ×