Extreme Solarization-Resistant Reflection/Backscatter Probe

Product Details Versatile Sampling for Diffuse/Specular Reflectance, Backscatter & Fluorescence Various Wavelength and Environmental Durability Models Extreme Solarization-Resistant (XSR) Probe Features Ultra-Low Loss Fiber for Harsh UV Exposure Connects Directly with Ocean Optics Spectrometers & Accessories Ocean Optics Reflection/Backscatter Probes are compact, fiber-coupled sampling tools for measuring diffuse and specular reflectance, backscatter, or fluorescence in solids, solutions, or powders, and connect directly with Ocean Optics Spectrometers and Accessories . They provide quantitative insights into a sample’s color, appearance, and chemical composition. Choose from Visible–NIR, Solarization-Resistant, or XSR models for applications ranging from routine reflectance to demanding UV measurements. With durable jacketing, precision ferrules, and solarization-resistant fiber, the rugged design ensures reliable performance even in harsh conditions. Ocean Optics Reflection/Backscatter Probes can be optimized for UV applications, with the XSR probe featuring ultra-low loss fiber designed to withstand harsh UV exposure. Specifications General Model Number: QR450-7-XSR Title: Extreme Solarization-Resistant Reflection/Backscatter Probe Physical & Mechanical Properties Core Diameter (μm): 450 Jacket Material: Silicone Monocoil Long Term Bend Radius (cm): 16 Short Term Bend Radius (cm): 8 Cladding Diameter (μm): 500 Ferrule Diameter (inches): 0.25 Fiber Core Diameter (µm): 450 Length of Fiber (m): 2 Optical Properties Wavelength Range (nm): 180 – 900 Material Properties Buffer Material: Aluminum, Nylon, Silicone Regulatory Compliance RoHS 2015: Compliant × Certificate of Conformance: View × Reach 250: Compliant ×