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Description
Product Details Long Working Distances to Reduce Risk of Specimen Damage Correction Collars to Adjust for Specimen Thickness Ideal for Silicon Wafer Inspection Olympus Plan Achromatic Near-Infrared Objectives provide high transmission between 700 – 1600nm, making them an excellent choice for near-infrared microscopy when coupled with an NIR tube lens. These objectives feature long working distances to reduce the risk of damage to specimens and support up to field number 22 for observation. Magnifications of 20X and higher feature a correction collar to correct for aberrations based on the thickness of either the glass or silicon substrate being inspected. Olympus Plan Achromatic Near-Infrared Objectives are ideal for use in silicon wafer inspection to view the internal structure for defects. Specifications General Model Number: LCPLN100XIR Compatible Tube Lens Focal Length (mm): Focal Length: 180mm Type: Microscope Objective Style: Infinity Corrected Manufacturer: Olympus Physical & Mechanical Properties Field of View (mm): 0.22 Length excluding Threads (mm): 43.80 Maximum Diameter (mm): 31.00 Weight (g): 184 Optical Properties Compatible Cover Glass Thickness (mm): Glass: 0 – 0.7mm Silicon: 0 – 1.0mm Focal Length FL (mm): 1.80 Magnification: 100X Numerical Aperture NA: 0.85 Resolving Power (μm): 0.39 Depth of Field (μm): 0.38 Working Distance (mm): Glass: 1.20 – 0.90mm Silicon: 1.20 – 1.05mm Wavelength Range (nm): 400 – 1600 Field Number (mm): 22 Parfocal Length (mm): 45 Immersion Liquid: N/A Entrance Pupil Diameter (mm): 3.06 Threading & Mounting Mounting Threads: RMS / 20.32mm x 36 TPI Regulatory Compliance Certificate of Conformance: View ×
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SWIR M25.5 x 0.50 Mounted Machine Vision Filter
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